The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Jul. 25, 2019
Applicant:
Pratt & Whitney Canada Corp., Longueuil, CA;
Inventors:
Assignee:
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/402 (2006.01); B23Q 17/22 (2006.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G05B 19/402 (2013.01); B23Q 17/2241 (2013.01); G05B 2219/30 (2013.01); G05B 2219/33099 (2013.01); G05B 2219/41092 (2013.01); G05B 2219/50297 (2013.01); G06F 17/16 (2013.01);
Abstract
The method can include measuring the tridimensional positions of a reference feature for a first at least three different angular positions of the reference feature around the first rotation axis and a same first reference angular position around the second rotation axis, the reference feature being fixed relative to the component; and measuring the tridimensional positions of the reference feature for a second at least three different angular positions of the reference feature around the first rotation axis and a same second reference angular position around the second rotation axis.