The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Mar. 14, 2020
Applicant:

University of Connecticut, Farmington, CT (US);

Inventor:

Guoan Zheng, Vernon, CT (US);

Assignee:

University of Connecticut, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 15/10 (2006.01); G01N 1/28 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G01N 1/2806 (2013.01); G01N 15/10 (2013.01); G02B 21/36 (2013.01); G01N 2015/1493 (2013.01);
Abstract

An imaging system includes a sample mount for holding a sample to be imaged, a light source configured to emit a light beam to be incident on the sample, a translation mechanism coupled to the sample mount and configured to scan the sample to a plurality of sample positions in a plane substantially perpendicular to an optical axis of the imaging system, a mask positioned downstream from the sample along the optical axis, and an image sensor positioned downstream from the mask along the optical axis. The image sensor is configured to acquire a plurality of images as the sample is translated to the plurality of sample positions. Each respective image corresponds to a respective sample position. The imaging system further includes a processor configured to process the plurality of images to recover a complex profile of the sample based on positional shifts extracted from the plurality of images.


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