The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jul. 28, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Naoya Nishimura, Kanagawa, JP;

Fumitake Mitobe, Kanagawa, JP;

Yuzo Fujiki, Kanagawa, JP;

Jun Takeda, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); G02B 1/14 (2015.01); G02B 1/04 (2006.01); H01L 27/32 (2006.01); H01L 51/52 (2006.01); G02F 1/13363 (2006.01);
U.S. Cl.
CPC ...
G02B 5/3083 (2013.01); G02B 1/04 (2013.01); G02B 1/14 (2015.01); G02F 1/13363 (2013.01); H01L 27/323 (2013.01); H01L 27/3232 (2013.01); H01L 51/5293 (2013.01); C09K 2323/031 (2020.08);
Abstract

An object of the present invention is to provide a laminate in which the coloring of reflected light is reduced. The laminate includes an optical film having a light absorption anisotropic film formed using a composition including a dichroic substance and having a transmittance of more than 50%, a λ/4 plate, and a metal electrode in this order, in which in a case where a degree (%) of polarization at a wavelength of λ of the optical film is defined as P(λ) and a reflectance (%) at the wavelength of λ of the metal electrode is defined as R(λ), a ratio of a minimum value of R/P to a maximum value of R/P at wavelengths of 450 nm, 550 nm, and 650 nm is more than 85%.


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