The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Nov. 09, 2020
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

James Fowe, Chicago, IL (US);

Bruce Bernhardt, Chicago, IL (US);

Filippo Pellolio, Sunnyvale, CA (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/26 (2010.01); G01S 19/06 (2010.01); G01S 19/07 (2010.01); G01S 19/23 (2010.01);
U.S. Cl.
CPC ...
G01S 19/26 (2013.01); G01S 19/06 (2013.01); G01S 19/07 (2013.01); G01S 19/23 (2013.01);
Abstract

An apparatus for matching probe measurements to a path in a geographic location includes a receiver, a window manager, a location generator, a path calculator, and an output. The receiver is configured to receive a stream of probe measurements. The window manager is configured to fill a window with the measurements, to select an additional measurement from the stream, and to select an oldest measurement in the window. The location generator is configured to generate candidate locations for the measurements in the window and the additional measurement. The path calculator is configured to match the oldest measurement to a candidate location. The output is configured to output a path-matched probe measurement based on the oldest measurement and the candidate location matched to the oldest measurement.


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