The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Dec. 20, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Taichi Tanaka, Tokyo, JP;

Osamu Hoshuyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9023 (2013.01); G06T 7/60 (2013.01); G06T 2207/10044 (2013.01);
Abstract

An image analysis device that ease association between an SAR image and an object is provided. The image analysis device includes: a stable reflection point identification unit that identifies, based on a plurality of synthetic aperture radar (SAR) images, stable reflection points at which reflection is stable in the plurality of SAR images; a phase identification unit that identifies a phase at each of the stable reflection points, based on the plurality of SAR images and a location of the stable reflection point in the plurality of SAR images; and a clustering means that clusters the stable reflection points, based on a Euclidian distance between each of the stable reflection points and a correlation of the phases at each of the stable reflection points.


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