The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Aug. 03, 2020
Applicants:

Bryce Macmillan, Oromocto, CA;

Bruce Balcom, Fredericton, CA;

Razieh Enjilela, Etobicoke, CA;

Armin Afrough, Frederiksberg, DK;

Inventors:

Bryce MacMillan, Oromocto, CA;

Bruce Balcom, Fredericton, CA;

Razieh Enjilela, Etobicoke, CA;

Armin Afrough, Frederiksberg, DK;

Assignee:

University of New Brunswick, Fredericton, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/50 (2006.01);
U.S. Cl.
CPC ...
G01R 33/50 (2013.01);
Abstract

A T-T* measurement which permits speciation of different components with restricted mobility in samples where a T-Tmeasurement is impossible is disclosed. Tracking the T-T* coordinate, and associated signal intensity changes, can reveal additional structural and/or dynamic information such as phase changes in rigid/semi-rigid biopolymer samples or pore level changes in morphology of the water environments in cement-based materials. In another aspect, the T-T* measurement may also be employed to discriminate composition in solid mixtures, a very significant analytical problem in industry. In a further aspect, the T-T* measurement has particular value in permitting a simple assignment of Tto different T* populations.


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