The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Mar. 18, 2019
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Masataka Midori, Tokyo, JP;

Hiroshi Kurihara, Tokyo, JP;

Tomohiro Honya, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0814 (2013.01); G01R 29/0892 (2013.01);
Abstract

An electromagnetic wave measurement point calculation device of the present invention is an electromagnetic wave measurement point calculation device that is configured to calculate a plurality of measurement points of an electromagnetic wave set on a surface surrounding a radiation source of the electromagnetic wave. The electromagnetic wave measurement point calculation device includes an arithmetic processing unit configured to calculate a measurement interval between a first measurement point and a second measurement point adjacent to the first measurement point using a correction coefficient determined according to the first measurement point and execute an electromagnetic wave measurement point calculation process for sequentially calculating the plurality of measurement points in a measurement range.


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