The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Nov. 15, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kenta Imai, Tokyo, JP;

Shunsuke Sasaki, Tokyo, JP;

Hiroya Umeki, Tokyo, JP;

Tatsuki Takakura, Tokyo, JP;

Takenori Okusa, Tokyo, JP;

Hiroki Fujita, Tokyo, JP;

Taku Sakazume, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1004 (2013.01); G01N 35/0092 (2013.01);
Abstract

To provide an automated analyzer capable of shortening analysis time. The automated analyzer includes a vessel which contains a mixed solution of a specimen and a reagent; and a control unit which controls a first operation performed on the vessel, a second operation performed on the vessel after the first operation, and a third operation performed on a predetermined mechanism of the automated analyzer before the second operation, in which the control unit performs the first operation and the third operation in parallel. Alternatively, the automated analyzer includes a control unit which controls a first operation performed on the vessel, a second operation performed on the vessel after the first operation, and a third operation performed on a predetermined mechanism of the automated analyzer after the first operation, in which the control unit performs the second operation and the third operation in parallel.


Find Patent Forward Citations

Loading…