The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Nov. 13, 2017
Hitachi High-tech Corporation, Tokyo, JP;
Masashi Akutsu, Tokyo, JP;
Akihisa Makino, Tokyo, JP;
Hiroyuki Mishima, Tokyo, JP;
Akihiro Yasui, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
The present invention is provided with a sample rack insertion unitthat is capable of holding one or more sample rackshaving mounted therein one or more sample containersaccommodating a sample to be analyzed, one or more analysis devicesfor analyzing the sample accommodated in the sample containers, a sample rack conveyance unitfor conveying the sample racksfrom the sample rack insertion unitto the analysis devices, and a control devicefor acquiring, for each analysis device, load information that is information expressing an operating condition of the analysis device, and, if there is an analysis devicefor which the load information is larger than a predetermined conveyance permission value, carrying out control so as to stop the conveyance of the sample racksfrom the sample rack insertion unitto the analysis device(s). As a result of this configuration, it is possible to mitigate in-device sample conveyance congestion occurring as a result of the insertion of many samples and keep the sample environment and analysis processing power at high levels.