The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Apr. 06, 2018
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 33/574 (2006.01); G06F 17/15 (2006.01); G06F 17/18 (2006.01); G16B 45/00 (2019.01); C12Q 1/6851 (2018.01); G16B 40/00 (2019.01); G16B 25/10 (2019.01);
U.S. Cl.
CPC ...
G01N 33/574 (2013.01); C12Q 1/6851 (2013.01); G06F 17/15 (2013.01); G06F 17/18 (2013.01); G16B 40/00 (2019.02); G16B 45/00 (2019.02); G01N 33/57415 (2013.01); G01N 33/57446 (2013.01); G16B 25/10 (2019.02);
Abstract
Disclosed is a measurement method for measuring a test substance contained in a biological sample based on a predetermined measurement principle, comprising acquiring a first measured value of the test substance using a first measurement reagent, and operating the first measured value to an arithmetic value when measured using a second measurement reagent different from the first measurement reagent, by using arithmetic information designed to make a first cut-off value for the measured value obtained using the first measurement reagent correspond to a second cut-off value for a measured value obtained using the second measurement reagent.