The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Apr. 22, 2019
Applicant:
Ontera Inc., Santa Cruz, CA (US);
Inventors:
Yanan Zhao, Felton, CA (US);
William McKenna, Santa Cruz, CA (US);
William B. Dunbar, Santa Cruz, CA (US);
Assignee:
Ontera Inc., Santa Cruz, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); G16B 30/00 (2019.01); G01N 27/447 (2006.01); G16B 40/10 (2019.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); G01N 27/44791 (2013.01); G01N 33/48792 (2013.01); G16B 30/00 (2019.02); G16B 40/10 (2019.02);
Abstract
Disclosed herein are methods and compositions for determining an improved estimate of the fractional abundance of target analytes (e.g., specific polynucleotide sequences) in a sample using a nanopore sensor having one or more nanopores-, e.g., by correcting errors inherent to identifying and correlating electrical signals to amounts of a target analyte or reference analyte in a sample.