The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Mar. 30, 2018
Nec Corporation, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An inspection apparatus comprises a chassis position/attitude estimator to estimate position/attitude information of a moving body and generate a chassis position/attitude estimation signal, a hammering tester hammer part error signal generator to generate a hammering tester hammer part error signal, a hammering tester hammer part position/attitude signal generator to generate a hammering tester hammer part position/attitude signal, a first sensor data frequency characteristic interpolator to generate a first sensor data frequency characteristic interpolation signal from the received chassis position/attitude estimation signal, a second sensor data frequency characteristic interpolator to generate a second sensor data frequency characteristic interpolation signal from the received hammering tester hammer part error signal and the received hammering tester hammer part position/attitude signal, and a hammering tester hammer part position/attitude estimator to generate a hammering tester hammer part position/attitude estimation signal from the received first sensor data frequency characteristic interpolation signal and the received second sensor data frequency characteristic interpolation signal.