The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Feb. 11, 2020
Applicant:

Trividia Health, Inc., Fort Lauderdale, FL (US);

Inventor:

Steven V. Leone, Lake Worth, FL (US);

Assignee:

Trividia Health, Inc., Fort Lauderdale, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01); C12Q 1/54 (2006.01); G01N 27/22 (2006.01); G01N 33/543 (2006.01); G01N 27/413 (2006.01); G01N 27/416 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3274 (2013.01); C12Q 1/54 (2013.01); G01N 27/22 (2013.01); G01N 27/3272 (2013.01); G01N 27/3273 (2013.01); G01N 27/413 (2013.01); G01N 27/416 (2013.01); G01N 33/5438 (2013.01);
Abstract

The present disclosure provides a system for measuring a property of a sample comprising: a test strip for collecting the sample; a diagnostic measuring device configured to receive the test strip and measure a concentration of an analyte in the sample received on the test strip; and the diagnostic measuring device further comprising a processor programmed to execute an analyte correction for correcting a measurement of the sample due to one or more interferents, comprising: calculating an interferent impedance measurement including a magnitude measurement and a phase measurement using a difference identity to generate a sinusoidal signal with an amplitude proportional to the phase difference; and adjusting the measurement of the analyte in the sample using that the calculated interferent impedance measurement.


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