The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Dec. 28, 2018
Applicant:
Kao Corporation, Tokyo, JP;
Inventors:
Yu Gabe, Bunkyo-ku, JP;
Shinya Kasamatsu, Utsunomiya, JP;
Osamu Osanai, Chiba, JP;
Katsuya Takeda, Hiratsuka, JP;
Yoko Nakajima, Kawasaki, JP;
Assignee:
KAO CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/76 (2006.01); G01N 21/33 (2006.01); G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
G01N 21/763 (2013.01); G01N 21/33 (2013.01); G01N 21/63 (2013.01);
Abstract
The present invention provides a method for determining a sensitivity to ultraviolet light non-invasively and immediately. A method for determining a UV sensitivity is provided involving: a step of irradiating the skin of a test subject with ultraviolet light to determine the UV sensitivity using the amount of biophotons to be detected within a specific period after the irradiation, wherein 50% or more of the specific period overlaps a period from 1 to 3 minutes after the irradiation.