The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Jun. 05, 2020
Applicant:
Santec Corporation, Aichi, JP;
Inventor:
Changho Chong, Los Altos, CA (US);
Assignee:
SANTEC CORPORATION, Komaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G01H 9/00 (2006.01); G01B 9/02015 (2022.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3172 (2013.01); G01B 9/02023 (2013.01); G01H 9/004 (2013.01); G01M 11/085 (2013.01);
Abstract
Systems and methods for alignment and testing of a photonic device include a light source, an interferometer, a detector, and a processing circuit. The processing circuit may generate control signal(s) for the light source to project a beam through the interferometer to a device under testing (DUT). The interferometer may receive an interference beam from an optical fiber of the DUT. The processing circuit may align optical fiber(s) for the DUT, determine one or more characteristics for the DUT, and so forth based on the interference beam and a reference beam generated by the interferometer.