The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Aug. 24, 2020
Applicant:

Tdk-micronas Gmbh, Freiburg, DE;

Inventors:

Yan Bondar, Waldkirch, DE;

Marcus Christian Meyer, Malsch, DE;

Hans Christian Paul Dittmann, Pforzheim, DE;

Assignee:

TDK-Micronas GmbH, Freiburg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/14 (2006.01); H01L 43/06 (2006.01); H01L 43/04 (2006.01); G01P 3/487 (2006.01);
U.S. Cl.
CPC ...
G01D 5/145 (2013.01); G01P 3/487 (2013.01); H01L 43/04 (2013.01); H01L 43/06 (2013.01);
Abstract

An integrated rotation-angle sensor unit in a measuring system for rotation angle determination, with a shaft that is rotatable about an axis of rotation with a transmitter, The sensor unit has a semiconductor layer with a top surface that can be arranged perpendicular to the axis of rotation and has a bottom surface, and two monolithic Hall sensor systems are implemented in the semiconductor layer. Each Hall sensor system has at least a first Hall sensor, a second Hall sensor, and a third Hall sensor, and the three Hall sensors of the first Hall sensor system are arranged on a first circle that is parallel to the top surface of the semiconductor layer and can be arranged concentrically around the axis of rotation.


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