The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Sep. 24, 2018
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Miyuki Murakami, Hino, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/06 (2006.01); G01N 21/49 (2006.01); G01S 17/00 (2020.01); G01S 17/89 (2020.01); G01S 17/36 (2006.01); G01N 21/27 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01C 3/06 (2013.01); G01N 21/27 (2013.01); G01N 21/49 (2013.01); G01S 17/00 (2013.01); G01S 17/36 (2013.01); G01S 17/89 (2013.01); G01N 2021/4709 (2013.01);
Abstract

A measuring apparatus includes: a light source device that projects light or light of which intensity is periodically modulated onto a measurement object; a light receiver that receives backscattered light of light projected by the light source device from the measurement object; and a processor comprising hardware, the processor being configured to: measure TOF information of the light projected by the light source device and the backscattered light received by the light receiver; acquire distances from a surface of the measurement object to the light source device and the light receiver; and calculate an internal propagation distance in the measurement object according to the measured TOF information and the acquired distances.


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