The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Aug. 07, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Masahiro Murota, Yamanashi-ken, JP;

Yonpyo Hon, Yamanashi-ken, JP;

Akira Yamamoto, Yamanashi-ken, JP;

Tomoki Shimizu, Yamanashi-ken, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/08 (2006.01); G01B 11/255 (2006.01); B23Q 17/22 (2006.01);
U.S. Cl.
CPC ...
G01B 11/08 (2013.01); B23Q 17/2233 (2013.01); G01B 11/255 (2013.01);
Abstract

An on-machine measurement device that locates a tip position of a blade of a machining tool provided on a machining device includes: a measurement unit configured to measure, in a workpiece that has been machined by the machining tool, a height of a reference plane not machined by the machining tool and a height of a machined surface machined by the machining tool; and a locating unit configured to locate the tip position of the blade of the machining tool based on information on a machining depth specified at the time of machining of the workpiece, and the height of the reference plane and the height of the machined surface that are measured by the measurement unit.


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