The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Apr. 09, 2019
Mitsui Chemicals, Inc., Tokyo, JP;
Masakazu Tanaka, Yokohama, JP;
Toyoaki Sasaki, Narashino, JP;
Tomoaki Matsugi, Kisarazu, JP;
Sadahiko Matsuura, Iwakuni, JP;
Naoto Matsukawa, Hatsukaichi, JP;
Masatoshi Chinaka, Iwakuni, JP;
MITSUI CHEMICALS, INC., Tokyo, JP;
Abstract
A 4-methyl-1-pentene polymer particle (X) which satisfies the following requirements (X-a), (X-b) and (X-c): (X-a) being composed of a 4-methyl-1-pentene polymer which has a content of a constitutional unit derived from 4-methyl-1-pentene being 30.0 to 99.7% by mol, and a content of a constitutional unit derived from at least one olefin selected from ethylene and an α-olefin having 3 to 20 carbon atoms (except for 4-methyl-1-pentene) being 0.3 to 70.0% by mol; (X-b) having, when measured in a cross fractionation chromatograph apparatus (CFC) using an infrared spectrophotometer as a detector part, at least one peak A of an amount of a component eluted present in the range of 100 to 140° C., and at least one peak B of an amount of a component eluted present at lower than 100° C.; and (X-c) having a meso diad fraction (m) measured byC-NMR falling within the range of 95.0 to 100%.