The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Feb. 21, 2019
Applicant:

Hiwin Technologies Corp., Taichung, TW;

Inventors:

Mei-Yu Huang, Taichung, TW;

Ming-Shiou Liu, Taichung, TW;

Assignee:

HIWIN TECHNOLOGIES CORP., Taichung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/04 (2006.01); G05B 19/18 (2006.01); B25J 9/16 (2006.01); G06V 10/75 (2022.01); G06V 20/10 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
B25J 9/1666 (2013.01); B25J 9/1669 (2013.01); G06V 10/7515 (2022.01); G06V 20/10 (2022.01); G06V 20/64 (2022.01); G05B 2219/40053 (2013.01); G05B 2219/40485 (2013.01);
Abstract

A system for eliminating interference of randomly stacked workpieces is disclosed. The system includes a three-dimensional sensing module, a pick-up apparatus and a control module. The control module is coupled to the three-dimensional sensing module and the pick-up apparatus. The control module is configured to control the three-dimensional sensing module to capture a three-dimensional image, analyze the three-dimensional image to obtain an image information, select a target workpiece to be picked up according to the image information, arrange an interference elimination path for the target workpiece, and control the pick-up apparatus to eliminate interference of the target workpiece according to the interference elimination path.


Find Patent Forward Citations

Loading…