The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Feb. 03, 2020
Applicant:

Bien-air Holding SA, Biel/Bienne, CH;

Inventors:

Daniel Nicolet, Biel/Bienne, CH;

Yann Gâteau, Biel/Bienne, CH;

Davide Sarchi, Zürich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 17/16 (2006.01); A61B 5/00 (2006.01); A61C 1/00 (2006.01); A61C 1/12 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 5/4509 (2013.01); A61B 5/0004 (2013.01); A61B 5/4542 (2013.01); A61B 5/7278 (2013.01); A61C 1/003 (2013.01); A61C 1/0007 (2013.01); A61C 1/12 (2013.01); A61B 5/682 (2013.01); A61B 2090/066 (2016.02);
Abstract

The present invention relates to a device and a method for measuring osseous quality.


Find Patent Forward Citations

Nicolet, Daniel. (2022). Method and tool for measuring osseous quality (U.S. Patent No. 11484249). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11484249

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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