The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jul. 22, 2020
Applicant:

Eyeque Inc., Newark, CA (US);

Inventors:

Noam Sapiens, Newark, CA (US);

John Serri, Newark, CA (US);

Johan Borglin, Newark, CA (US);

Assignee:

EyeQue Inc., Newark, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); G01M 11/0228 (2013.01);
Abstract

Consumer products such as refraction measurement devices may be used for obtaining refraction measurements allow consumers to track their vision without visiting an optometrist or ophthalmologist. Such consumer products may work in concert with smart phones or other products having a touch screen that present images to refraction measurement devices. Smart phones may have resolution rates, sometimes measured as PPI or pixels per inch that are unknown to the user and/or refraction measurement device. One aspect of the invention is to provide an optical interface for the user to manually match the view port boundary of the smartphone to comport with the view port boundary of the refraction measurement device. Another aspect of the invention is the use of pre-distortion in images presented to the user. By noting the corrective movements exerted by the user upon the refractive measurement device, the user's own refractive error can be derived.


Find Patent Forward Citations

Sapiens, Noam. (2022). Method and apparatus for refraction and vision measurement (U.S. Patent No. 11484196). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11484196

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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