The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Aug. 17, 2018
Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;
Johan Rune, Lidingö, SE;
Icaro L. J. Da Silva, Solna, SE;
Wei Shen, Linköping, SE;
Pradeepa Ramachandra, Linköping, SE;
TELEFONAKTIEBOLAGET LM ERICSSON (PUBL), Stockholm, SE;
Abstract
A method for evaluating cell quality includes obtaining cell quality information and determining, based on the cell quality information, a first number, X, of beams whose qualities are above a threshold, T, for a first cell and a second number, Y, of beams whose qualities are above the threshold, T, for a second cell. The method includes complementing a third number, M, of fictive beams to offset a difference between the first number, X, of beams and the second number, Y, of beams, and measuring a first average beam quality, Q, for the first cell and a second average beam quality, Q, for the second cell. The method may include a certain number fictive beams with assigned beam quality when calculating cell qualities for cells which are included in comparison.