Digital serial read-out architecture

Abstract

Techniques are described for implementing read-out architectures to support high-speed serialized read-out of a large number of digital bit values, such as for high-resolution pixel conversions in CMOS image sensor applications. For example, outputs from a large number of digital data sources (e.g., counters) are coupled with transmission gates of the read-out architecture, and the transmission gates are sequentially enabled, thereby shifting in bit data from the data sources one at a time. The transmission gates are grouped into gate groups. For each gate group, embodiments seek balance total path delay across the gate groups by controlling clock and data path delays to be inversely related, and ensuring that total path delays for all gate groups are within a single clock period. Some embodiments include a partitioned bus for further gate group-level control over the path delay and data bus capacitance.