The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Dec. 31, 2020
Zoox, Inc., Foster City, CA (US);
Robert Nicholas Moor, San Mateo, CA (US);
Nathan Duarte, Foster City, CA (US);
Zoox, Inc., Foster City, CA (US);
Abstract
A blemish detection and characterization system and techniques for an optical imaging device includes determining a ratio of the light intensity of the image lost to the blemish relative to an expected light intensity of the image without the blemish. The system and technique may include receiving an image, transforming an image into a processed image with transformations and filters, as well as determining a relative magnitude of an intensity of a portion of the processed image relative to another area of the image. The system and technique may include taking an action based on the relative magnitude including rejecting a sensor, reworking the sensor, cleaning the sensor, or providing information about the blemish to a system to use in weighing data collected from the sensor.