The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Feb. 11, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Christian Djelassi-Tscheck, Villach, AT;

Ulisse Lorenzo Lillo, Villach, AT;

Michael Luschin, Krumpendorf, AT;

Mario Tripolt, Ferndorf, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/00 (2006.01); H02H 1/00 (2006.01); H03K 17/082 (2006.01); H02H 3/087 (2006.01); H02H 9/02 (2006.01);
U.S. Cl.
CPC ...
H02H 3/006 (2013.01); H02H 1/0007 (2013.01); H02H 3/087 (2013.01); H02H 9/02 (2013.01); H03K 17/082 (2013.01);
Abstract

In accordance with an embodiment, a circuit includes: a supply pin and an output pin for connecting a load, and a configuration pin; a semiconductor switch connected between the supply pin and the output pin and configured to establish or to block a current path between the supply pin and the output pin depending on a control signal; and a control circuit configured to generate the control signal for the semiconductor switch taking account of a first parameter, and set the first parameter depending on a component parameter of an external component connected to the configuration pin. The first parameter is set to a first standard value when the component parameter is less than a first threshold value, and the first parameter is set to a second standard value when the component parameter is greater than a second threshold value.


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