The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Feb. 05, 2019
Applicant:
Visotec Gmbh, Lubeck, DE;
Inventors:
Helge Sudkamp, Lubeck, DE;
Hendrik Spahr, Lubeck, DE;
Dierck Hillmann, Lubeck, DE;
Peter Koch, Lubeck, DE;
Gereon Huttmann, Lubeck, DE;
Assignee:
Visotec GmbH, Lubeck, DE;
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/19 (2022.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01); G01B 9/02 (2022.01); G01B 9/02091 (2022.01); G03H 1/00 (2006.01); G03H 1/04 (2006.01); G06V 10/145 (2022.01);
U.S. Cl.
CPC ...
G06V 40/19 (2022.01); A61B 3/102 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01); G01B 9/02047 (2013.01); G01B 9/02084 (2013.01); G01B 9/02091 (2013.01); G03H 1/0011 (2013.01); G03H 1/0443 (2013.01); G03H 1/0465 (2013.01); G06V 10/145 (2022.01); G03H 2001/0033 (2013.01); G03H 2001/0456 (2013.01); G03H 2001/0467 (2013.01); G03H 2210/33 (2013.01); G03H 2222/24 (2013.01);
Abstract
The invention relates to a free-beam interferometric method for illuminating a sequence of sectional areas in the interior of the light-scattering object. The method makes it possible for the user to select a larger image field and/or a higher image resolution than previously possible with the occurrence of self-interference of the specimen light from a scattering specimen.