The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Apr. 17, 2020
Applicant:

Scopio Labs Ltd., Tel Aviv, IL;

Inventors:

Ben Leshem, Tel Aviv, IL;

Eran Small, Yehud, IL;

Itai Hayut, Tel Aviv, IL;

Erez Na'Aman, Tel Aviv, IL;

Eyal Ben-Bassat, Tel Aviv, IL;

Assignee:

SCOPIO LABS LTD., Tel Aviv, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G01B 11/06 (2006.01); G01B 11/22 (2006.01); G01N 21/25 (2006.01); G06V 10/56 (2022.01); G06V 10/141 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06V 20/695 (2022.01); G01B 11/06 (2013.01); G01B 11/22 (2013.01); G01N 21/251 (2013.01); G06V 10/141 (2022.01); G06V 10/56 (2022.01); G06V 20/647 (2022.01);
Abstract

A microscope for adaptive sensing may comprise an illumination assembly, an image capture device configured to collect light from a sample illuminated by the assembly, and a processor. The processor may be configured to execute instructions which cause the microscope to capture, using the image capture device, an initial image set of the sample, identify, in response to the initial image set, an attribute of the sample, determine, in response to identifying the attribute, a three-dimensional (3D) process for sensing the sample, and generate, using the determined 3D process, an output image set comprising more than one focal plane. Various other methods, systems, and computer-readable media are also disclosed.


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