The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Sep. 11, 2017
Applicant:

Hover Inc., San Francisco, CA (US);

Inventors:

Ajay Mishra, Palo Alto, CA (US);

William Castillo, San Carlos, CA (US);

A. J. Altman, San Francisco, CA (US);

Manish Upendran, San Francisco, CA (US);

Assignee:

HOVER INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/42 (2022.01); G06N 3/08 (2006.01); G06K 9/62 (2022.01); G06T 7/60 (2017.01); G06T 17/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06V 10/42 (2022.01); G06K 9/6256 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 7/60 (2013.01); G06T 17/00 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30132 (2013.01); G06T 2210/04 (2013.01);
Abstract

A computer system trains a machine learning model to estimate a real-world measurement of a feature of a structure. The machine learning model is trained using a plurality of digital image sets, wherein each image set depicts a particular structure, and a plurality of measurements, wherein each measurement is a measurement of a feature of a particular structure. After the machine learning model is trained, it is used to estimate a measurement of a feature of a particular structure depicted in a particular image set.


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