The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Jul. 01, 2020
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Daniel Wagner, Vienna, AT;
Qi Pan, Vienna, AT;
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/246 (2017.01); G06T 19/00 (2011.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06T 7/246 (2017.01); G06T 7/74 (2017.01); G06T 2207/30244 (2013.01);
Abstract
Disclosed are a system, apparatus, and method for in-situ creation of planar natural feature targets. In one embodiment, a planar target is initialized from a single first reference image one or more subsequent images are processed. In one embodiment, the planar target is tracked in six degrees of freedom upon the processing of the one or more subsequent images and a second reference image is selected from the processed one or more subsequent images. In one embodiment, upon selecting the second reference image the planar target is refined to a more accurate planar target.