The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Oct. 19, 2020
Applicant:

Beijing Sensetime Technology Development Co., Ltd., Beijing, CN;

Inventors:

Yuanzhen Hao, Beijing, CN;

Mingyang Huang, Beijing, CN;

Jianping Shi, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 19/20 (2011.01); G06T 17/20 (2006.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); G06T 7/70 (2017.01); G06T 19/20 (2013.01); G06V 40/161 (2022.01); G06V 40/168 (2022.01); G06T 2207/30201 (2013.01); G06T 2219/2004 (2013.01);
Abstract

An image processing method and apparatus, and a computer-readable storage medium are provided. The method includes: determining a first region matching a target object in a first image; determining a deformation parameter based on a preset deformation effect, the deformation parameter being used for determining a position deviation, generated based on the preset deformation effect, of each pixel point of the target object; and performing deformation processing on the target object in the first image based on the deformation parameter to obtain a second image.


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