The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Jan. 24, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Orna Raz, Haifa, IL;

Marcel Zalmanovici, Kiriat Motzkin, IL;

Aviad Zlotnick, Mitzpeh Netofah, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/285 (2019.01);
Abstract

Embodiments of the present systems and methods may provide improved machine learning performance even though data drift has occurred. For example, a method may comprise providing a machine learning model in a computer system, operating the machine learning model using a first dataset to obtain results of the first dataset, operating the machine learning model using a second dataset to obtain results of the second dataset, performing statistical testing on a confidence distribution of results of the first dataset and of results of the second dataset to determine a difference in a result confidence distribution between the first dataset and of the second dataset, and determining whether data included in the second dataset has data drift relative to the first dataset based on the difference in a result confidence distribution between the first dataset and of the second dataset.


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