The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Nov. 09, 2018
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Satish Kumar Mopur, Bangalore, IN;

Gregory S. Battas, Bangalore, IN;

Gunalan Perumal Vijayan, Bangalore, IN;

Krishnaprasad Lingadahalli Shastry, Bangalore, IN;

Saikat Mukherjee, Bangalore, IN;

Ashutosh Agrawal, Bangalore, IN;

Sridhar Balachandriah, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); H04L 67/12 (2022.01); G06N 5/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 3/08 (2013.01); G06N 5/047 (2013.01); H04L 67/12 (2013.01);
Abstract

A system and method for accounting for the impact of concept drift in selecting machine learning training methods to address the identified impact. Pattern recognition is performed on performance metrics of a deployed production model in an Internet-of-Things (IoT) environment to determine the impact that concept drift (data drift) has had on prediction performance. This concurrent analysis is utilized to select one or more approaches for training machine learning models, thereby accounting for the temporal dynamics of concept drift (and its subsequent impact on prediction performance) in a faster and more efficient manner.


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