The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Jun. 30, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Valerio Perrone, Berlin, DE;

Michele Donini, Berlin, DE;

Krishnaram Kenthapadi, Sunnyvale, CA (US);

Cedric Philippe Archambeau, Berlin, DE;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 7/00 (2006.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06F 9/54 (2013.01); G06N 20/00 (2019.01);
Abstract

Hyperparameters for tuning a machine learning system may be optimized for fairness using Bayesian optimization with constraints for accuracy and bias. Hyperparameter optimization may be performed for a received training set and received accuracy and fairness constraints. Respective probabilistic models for accuracy and bias of the machine learning system may be initialized, then hyperparameter optimization may include iteratively identifying respective values for hyperparameters using analysis of the respective models performed using an acquisition function implementing constrained expected improvement on the respective models, training the machine learning system using the identified values to determine measures of accuracy and bias, and updating the respective models using the determined measures.


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