The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Feb. 25, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Hirohide Tsunoda, Yamanashi, JP;

Wataru Shiraishi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G05B 19/4065 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G05B 19/4065 (2013.01); G06N 20/00 (2019.01);
Abstract

A machining condition adjustment device includes a data acquisition unit that acquires at least one piece of data indicating a state of machining including a machining type in a machine tool, a priority condition storage unit that stores priority condition data in which the machining type is associated with a priority condition, a preprocessing unit that produces data to be used for machine learning, and a machine learning device that carries out processing of the machine learning related to at least either of a machining condition and a machining parameter for machining by the machine tool. The machine learning device includes a learning model storage unit that stores a plurality of learning models generated for each machining type and a learning model selection unit that selects a learning model, based on the machining type.


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