The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

May. 31, 2018
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Li Deng, Menlo Park, CA (US);

Suhas Chelian, San Jose, CA (US);

Ajay Chander, San Francisco, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06K 9/626 (2013.01); G06K 9/623 (2013.01); G06K 9/6282 (2013.01); G06N 20/00 (2019.01);
Abstract

According to an aspect of an embodiment, a method may include obtaining a data set that includes categories (or features), and a target criteria. The method may further include obtaining a first decision tree model using the data set. The method may further include ranking the categories based on the first decision tree model and removing low-ranking categories from the data set. The method may further include generating a second decision tree model using the data set. The second decision tree model may include branch nodes. Each of branch nodes may represent a branch criteria. The method may further include pruning a branch node. The method may further include designating a remaining branch nodes as a rule node. The method may further include generating a rule based on the branch criteria of the rule node and presenting the rule in a graphical user interface.


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