The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Aug. 25, 2020
Applicant:

Beijing Sensetime Technology Development Co., Ltd., Beijing, CN;

Inventors:

Kunlin Yang, Beijing, CN;

Jun Hou, Beijing, CN;

Xiaocong Cai, Beijing, CN;

Shuai Yi, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06V 10/32 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6232 (2013.01); G06K 9/6256 (2013.01); G06K 9/6268 (2013.01); G06V 10/32 (2022.01);
Abstract

The present disclosure relates to an image processing method and device, an electronic apparatus and a storage medium. The method comprises: performing feature extraction on an image to be processed to obtain a first feature map of the image to be processed; splitting the first feature map into a plurality of first sub-feature maps according to dimension information of the first feature map and a preset splitting rule, wherein the dimension information of the first feature map comprises dimensions of the first feature map and size of each dimension; performing normalization on the plurality of first sub-feature maps respectively to obtain a plurality of second sub-feature maps; and splicing the plurality of second sub-feature maps to obtain a second feature map of the image to be processed. Embodiments of the present disclosure can reduce the statistical errors during normalization of a complete feature map.


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