The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Sep. 27, 2020
Harbin Institute of Technology, Heilongjiang, CN;
Other;
Abstract
Disclosed is a capability test method based on a joint test support platform. The method includes steps of describing an initial capability in a test, combining a capability to be developed based on the initial capability, and determining an evaluation strategy and a joint task background information of the test. Further, the method includes generating a logical shooting range for the joint test support platform according to the joint task background information, developing a test scenario according to the joint task background information and the logical shooting range, decomposing the test scenario, determining a test plan corresponding to the test scenario, executing the test according to the test plan, analyzing and evaluating a test result of the test, and generating one or more joint capability evaluation reports for the test.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile