The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Apr. 23, 2019
Vmware, Inc., Palo Alto, CA (US);
Arnak Poghosyan, Yerevan, AM;
Ashot Nshan Harutyunyan, Yerevan, AM;
Naira Movses Grigoryan, Yerevan, AM;
Nicholas Kushmerick, Seattle, WA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
Automated processes and systems for detecting abnormally behaving objects of a distributed computing system are described. Processes and systems obtain metrics that are generated in a historical time window and are associated with an object of the distributed computing system. Processes and system use the metrics to compute a time-dependent system indicator over the historical time window. Each value of the system indicator corresponds to a point in time of the historical time window when the object was in a normal or an abnormal state. Processes and systems use the normal and abnormal states of the system indicator in the historical time window to train a state classifier that is used to detect run-time abnormal behavior of the object. When the state classifier identifies abnormal behavior of the object, an alert is generated, indicating the abnormal behavior of the object.