The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Aug. 07, 2018
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Susumu Shiizuka, Tokyo, JP;
Masumi Nomura, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A monitoring target selecting device configured to output a measurement parameter to an abnormality diagnosis device to diagnose an abnormal event of a plant based on a correlation value representing a mutual correlation between measurement parameters, and includes a classification unit to acquire a plurality of measurement parameters measured in the plant, classify a change behavior of measured value over a time for each of the plurality of measurement parameters in a first period, and classify a change behavior of a measured value over a time for each of the plurality of measurement parameters in each of the first period and a second period, and a selection unit to select the measurement parameter as a measurement parameter to be output to the abnormality diagnosis device on the basis of a result of comparing a behavior of the measurement parameters in the first period to the second period.