The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Feb. 18, 2020
Applicant:

Ptc Inc., Needham, MA (US);

Inventors:

David Wolf, Lakewood, CO (US);

Michael Prudhomme, Englewood, CO (US);

Swapan Jha, Needham, MA (US);

Jeff Milkey, Phoenix, AZ (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4099 (2006.01); G05B 19/4063 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); G05B 19/4063 (2013.01); G05B 2219/32368 (2013.01); G05B 2219/35082 (2013.01); G05B 2219/35227 (2013.01); Y02P 90/02 (2015.11); Y02P 90/80 (2015.11);
Abstract

Exemplary embodiments relate to methods, mediums, and systems for associating information, including critical-to-quality (CTQ) information such as minimum or maximum part dimensions, with parts in a three-dimensional model of a product. The information may be identified by performing a failure mode effect analysis (FMEA) against the model. The information is stored with the model data (e.g., in the form of an annotation applied to a model feature corresponding to the part in question). The model data may be consulted by product lifecycle management (PLM) applications during various phases of the product's lifecycle. Among other possibilities, the information may be used to automatically generate regulatory compliance documentation, to ensure product quality standards are met during a manufacturing process, or to perform postproduction quality monitoring of the product.


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