The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Apr. 29, 2019
Fanuc Corporation, Yamanashi, JP;
Masao Kamiguchi, Yamanashi, JP;
Noboru Kurokami, Yamanashi, JP;
Shinichi Ogawa, Yamanashi, JP;
Yuuya Miyahara, Yamanashi, JP;
Yasushi Okajima, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
To provide an analysis device, an analysis method, and an analysis program capable of analyzing a machining state while associating machine data output during operation of a machine tool and measured data containing the size of an actual machined part measured by a measuring machine with each other. An analysis device comprises: a collection unit that collects an aggregate of machine data output during operation of a machine tool and an aggregate of measured data containing measurement points where the size of a machined part machined by the machine tool has been measured by a measuring instrument; and a feature extraction unit that selects machine data corresponding to an arbitrary measurement point, in the aggregate of the measured data from the aggregate of the machine data, and extracts the selected machine data as a feature at the arbitrary measurement point.