logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11480613 B1

PDFFull Text
Date of Patent:
Oct. 25, 2022

Filed:

Dec. 18, 2020

Method and/or system for testing devices in non-secured environment

Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Richard Andrew Paterson, Thurgoland, GB;

Rainer Herberholz, Great Abington, GB;

Peter Andrew Rees Williams, Great Abington, GB;

Oded Golombek, Even Yehuda, IL;

Einat Luko, Herzliya, IL;

Jeffrey Scott Boyer, Dripping Springs, TX (US);

Assignee:

Arm Limited, Cambridge, GB;

Attorney:

Berkeley Law & Technology Group, LLP

Primary Examiner:

John J Tabone, Jr

Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/3187 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G01R 31/28 (2006.01); H04L 9/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/2815 (2013.01); G01R 31/3187 (2013.01); G01R 31/31715 (2013.01); G01R 31/31724 (2013.01); G01R 31/318533 (2013.01); G01R 31/318597 (2013.01); H04L 9/0894 (2013.01);
Abstract

Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.

Find Patent Forward Citations

Paterson, Richard. (2022). Method and/or system for testing devices in non-secured environment (U.S. Patent No. 11480613). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11480613

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…