The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Jul. 30, 2021
Applicant:

Rohde & Schwarz Gmbh & CO KG, Munich, DE;

Inventors:

Bernhard Sterzbach, Munich, DE;

Byron-Lim Timothy Steffan, Munich, DE;

Andreas Dippon, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/44 (2006.01); G01R 21/02 (2006.01); G01R 29/10 (2006.01); G01R 29/08 (2006.01); G01R 21/133 (2006.01);
U.S. Cl.
CPC ...
G01R 21/02 (2013.01); G01R 21/133 (2013.01); G01R 29/0864 (2013.01); G01R 29/105 (2013.01);
Abstract

A measurement system for determining an energy usage parameter of an electronic device under test is described. The measurement system includes a thermal chamber and an analysis circuit. The thermal chamber includes a housing, a temperature regulator and a thermal control circuit. The housing encloses an interior space of the thermal chamber, wherein the interior space is configured to accommodate the device under test. The thermal control circuit is configured to control the temperature regulator to keep a temperature of the interior space at a predefined reference temperature. The thermal control circuit is configured to determine a power consumption of the temperature regulator, wherein the power consumption is associated with keeping the temperature of the interior space at the predefined reference temperature. The analysis circuit is configured to determine at least one energy usage parameter of the device under test based on the determined power consumption. Further, a method of determining an energy usage parameter of an electronic device under test is described.


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