The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Mar. 03, 2020
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Richard Eugene Klaassen, West Chester, OH (US);

Mark Partika, Blanchester, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01N 29/265 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/226 (2013.01); G01N 29/041 (2013.01); G01N 29/24 (2013.01); G01N 29/265 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01); G01N 2291/263 (2013.01);
Abstract

An acoustic inspection device and an associated method for inspecting a component are provided. The acoustic inspection device is portable and includes an acoustic transmitter and receiver that may be placed on opposite sides of an inspection region on the surface of the component. The acoustic transmitter has an array of acoustic transducers for generating an acoustic wave that travels along a surface of the component and the acoustic receiver has an array of acoustic transducers for receiving that acoustic wave. A controller determines at least one surface characteristic of the component from the measured acoustic wave, such as its crystalline structure or grain size.


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