The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Dec. 14, 2020
Vayyar Imaging Ltd, Yehud, IL;
Yuval Lomnitz, Herzlia, IL;
Jonathan Rosenfeld, Ramat hasharon, IL;
Doron Cohen, Tel-Aviv, IL;
Shachar Shayovitz, Ness Ziona, IL;
VAYYAR IMAGING LTD, Yehud, IL;
Abstract
Systems, device and methods are provided for measuring parameters of a medium such as the dielectric properties of a medium including a plurality of layers, using an array of sensors. The array includes at least two transducers and at least one transceiver attached to the at least two transducers, the at least one transceiver being configured to transmit at least one signal toward the medium and receive a plurality of signals affected by the medium; a data acquisition unit and at least one processor unit, configured to: process the affected plurality of signals to yield a plurality of transfer functions wherein each of the plurality of transfer functions including the medium response between two transducers of the at least two transducers as function of frequency or time; process the plurality of transfer functions to yield a plurality of statistical measures, and process the statistical measures to calculate the medium parameters.