The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Jan. 13, 2019
Applicant:
Litesentry Corporation, Northfield, MN (US);
Inventors:
Eric Hegstrom, Tucson, AZ (US);
Bryan Nelson, Burnsville, MN (US);
Assignee:
LiteSentry LLC, Burnsville, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/958 (2006.01); G01N 21/59 (2006.01); G01B 11/16 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G01B 11/18 (2013.01); G01N 21/59 (2013.01); G05B 19/41875 (2013.01); G01N 2201/126 (2013.01); G05B 2219/32368 (2013.01); G05B 2219/45234 (2013.01);
Abstract
An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.