The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
May. 31, 2018
Sony Corporation, Tokyo, JP;
Tomoyuki Umetsu, Tokyo, JP;
Masaaki Hara, Tokyo, JP;
Nobuhiro Hayashi, Kanagawa, JP;
Yasunobu Kato, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
The fine particle measurement apparatus according to the present technology includes a detection section, a multiplication factor setting section, a correction factor calculation section, and a spectrum generation section. The detection section has a plurality of detectors for detecting light from fine particles. The multiplication factor setting section sets a multiplication factor for each of the plurality of detectors. The correction factor calculation section calculates a correction factor on the basis of the set multiplication factor. The spectrum generation section generates spectral data by correcting a value detected by the detector, with the calculated correction factor.