The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Dec. 28, 2020
Seiko Epson Corporation, Tokyo, JP;
Takashi Toya, Chino, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
Provided is a measurement device including a spectroscope, a movement mechanism configured to relatively move the spectroscope in one direction, and one or more processors configured to determine whether a measurement position measured by the spectroscope is moved into a color patch, in which the one or more processors cause the spectroscope to execute measurement processing for a plurality of wavelengths set in advance while relatively moving the spectroscope in the one direction, and when at least one of amounts of variation of measured values with respect to each of the plurality of wavelengths obtained in the measurement processing exceeds a first threshold value and then each of the amounts of variation of the measured values of the plurality of wavelengths falls below a second threshold value which is less than or equal to the first threshold value, determine that the measurement position is moved into the color patch.