The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Dec. 30, 2020
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Douglas K. Herrmann, Webster, NY (US);

Chu-heng Liu, Penfield, NY (US);

Seemit Praharaj, Webster, NY (US);

Paul J. McConville, Webster, NY (US);

Jason M. LeFevre, Penfield, NY (US);

Michael J. Levy, Webster, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41F 33/00 (2006.01); B41N 3/08 (2006.01); B41F 7/24 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
B41F 33/0063 (2013.01); B41F 7/24 (2013.01); B41F 33/0054 (2013.01); B41N 3/08 (2013.01); G01B 11/0625 (2013.01); B41P 2233/30 (2013.01);
Abstract

According to aspects of the embodiments, there is provided a method of measuring the amount of fountain solution employed in a digital offset lithography printing system. Fountain solution thickness is measured using a glass roll at a lower temperature than the fountain solution. The lower temperature causes the fountain solution to undergo a change in state and in a solid state the fountain solution crystalizes and changes roll opacity with the thickness of the film. When radiated with a light source the opacity is continuously measured through the surface of the roller. The thickness of the crystallized fountain solution can then be determined via the opacity level increase by the crystallization and the impact to the opacity on the glass roll.


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